लेखक: Jaynarayan Tudu

समर्थन

1 द्वारा ईबुक Jaynarayan Tudu

Anand Darji & Sudeb Dasgupta: VLSI Design and Test
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers …
EPUB
अंग्रेज़ी
DRM
€114.66