This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
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भाषा अंग्रेज़ी ● स्वरूप EPUB ● ISBN 9783031215148 ● संपादक Anand Darji & Sudeb Dasgupta ● प्रकाशक Springer Nature Switzerland ● प्रकाशित 2022 ● डाउनलोड करने योग्य 3 बार ● मुद्रा EUR ● आईडी 8806031 ● कॉपी सुरक्षा Adobe DRM
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