This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
€56.73
यह ईबुक खरीदें और 1 और मुफ़्त पाएं!
भाषा अंग्रेज़ी ● स्वरूप PDF ● ISBN 9781483288932 ● संपादक K. Vedam ● प्रकाशक Elsevier Science ● प्रकाशित 2013 ● डाउनलोड करने योग्य 3 बार ● मुद्रा EUR ● आईडी 5736766 ● कॉपी सुरक्षा Adobe DRM
एक DRM सक्षम ईबुक रीडर की आवश्यकता है
एक ही लेखक से अधिक ईबुक / संपादक
36,496 इस श्रेणी में ईबुक
