This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
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भाषा अंग्रेज़ी ● स्वरूप EPUB ● ISBN 9789811074707 ● संपादक Sudeb Dasgupta & Brajesh Kumar Kaushik ● प्रकाशक Springer Singapore ● प्रकाशित 2017 ● डाउनलोड करने योग्य 3 बार ● मुद्रा EUR ● आईडी 6213070 ● कॉपी सुरक्षा Adobe DRM
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