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Sudeb Dasgupta & Brajesh Kumar Kaushik 
VLSI Design and Test [EPUB ebook] 
21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers

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Обкладинка Sudeb Dasgupta & Brajesh Kumar Kaushik: VLSI Design and Test (ePUB)

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

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Мова Англійська ● Формат EPUB ● ISBN 9789811074707 ● Редактор Sudeb Dasgupta & Brajesh Kumar Kaushik ● Видавець Springer Singapore ● Опубліковано 2017 ● Завантажувані 3 разів ● Валюта EUR ● Посвідчення особи 6213070 ● Захист від копіювання Adobe DRM
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