European Powder Diffraction Conference; August 2010, Darmstadt, Germany [PDF ebook] 

Frontmatter — PREFACE — Editorial Notes — European Powder Diffraction Conference Award for Young Scientists — European Powder Diffraction Conference Award for Distinguished Powder Diffractionists — Table of Contents — I. METHOD DEVELOPMENT AND APPLICATION — I.1 Determination of Crystal Structure — Complementarities between precession electron and X-ray powder diffraction — Differential Pair Distribution Function applied to Ce1-x Gdx O2-x/2 system — I.2 Qualitative and Quantitative Phase Analysis — A suitable method for quantitative phase analysis of samples with high amorphous content — UMo/Al nuclear fuel quantitative analysis via high energy X-ray diffraction — I.3 Microstructure and Line Broadening Analysis — Microstrain in nanocrystalline samples from atomistic simulation — Simulating the temperature effect in a powder diffraction pattern with molecular dynamics — A new combined approach to investigate stacking faults in lamellar compounds — Factors affecting diffraction broadening analysis — Crystallite size evolution in hydrothermal formation of kaolinite — Particle statistics in synchrotron powder diffractometry — High energy milling of Cu2O powders — Defects in nanocrystalline ceria xerogel — Determination of crystallite size distribution histogram in nanocrystalline anatase powders by XRD — Crystal growth mechanism of kaolinites deduced from crystallite size distribution — Diffraction peak broadening of energetic materials — Calculation of a line profile for the diffractometer with a primary monochromator — I.4 Texture — Characterization of weakly deformed limestone from Chotec, Bohemia by neutron transmission — Multiple scattering from textured polycrystals — II. INSTRUMENTAL — Powgen: A third-generation highresolution high-throughput powder diffraction instrument at the Spallation Neutron Source — Technical concept of the materials science beamline at ALBA — Instrumental calibration of laboratory X-ray powder diffractometers — New anti-air-scatter screen for powder XRD with linear position sensitive detectors — In-situ XRPD of hydrating cement with lab instrument: reflection vs. transmission measurements — In-house characterization of protein powder — Multiple reflections accompanying allowed and forbidden single reflections in bent Si-crystals — 2?-scanning 2D-area detector for high quality powder data collection using synchrotron radiation — III. SOFTWARE — Adaption of a Rietveld code towards clay structure description — Real-space powder diffraction computing on clusters of Graphics Processing Units — Evaluation of algorithms and weighting methods for MEM analysis from powder diffraction data — YAYLA, a program for handling area detector data of glasses — IV. MATERIALS — IV.1 Thin Layers — HTXRD study of atomic layer deposited noble metal thin films heat treated in oxygen — XRD real structure characterization of sputtered Au films different in thickness — Liquid-phase self-terminated growth of MOF thin films: An X-ray diffraction study — IV.2 Nanocrystalline and Amorphous Materials — X-ray study of structure of the Ti O2 nanotubes and nanowires — Core-Shell structure of nanocrystalline Al N in real and reciprocal spaces — Compression and thermal expansion of nanocrystalline Ti N — Diffraction analysis of grain growth in nanocrystalline Ni-W powders prepared by mechanical milling — Orientational degeneracy of antiferromagnetic exchange striction in anisotropic ultrafine Ni O nanocrystals — IV.3 Metals and Alloys — IV.3.1 General — X-ray diffraction analysis of phases in weldments of super duplex stainless steels — X-ray studies of martensitic transformation in Fe-Ni alloys rapidly quenched from the melt — ?-?-?-martensitic transitions influence on the martensite decomposition of quenched steel — IV.3.2 Microstructure, Stress and Texture — Strain relaxation and grain growth in 316LVM stainless steel annealed under pressure — Influence of elastic stress on stain