European Powder Diffraction Conference; August 2010, Darmstadt, Germany [PDF ebook] 

Frontmatter – PREFACE – Editorial Notes – European Powder Diffraction Conference Award for Young Scientists – European Powder Diffraction Conference Award for Distinguished Powder Diffractionists – Table of Contents – I. METHOD DEVELOPMENT AND APPLICATION – I.1 Determination of Crystal Structure – Complementarities between precession electron and X-ray powder diffraction – Differential Pair Distribution Function applied to Ce1-x Gdx O2-x/2 system – I.2 Qualitative and Quantitative Phase Analysis – A suitable method for quantitative phase analysis of samples with high amorphous content – UMo/Al nuclear fuel quantitative analysis via high energy X-ray diffraction – I.3 Microstructure and Line Broadening Analysis – Microstrain in nanocrystalline samples from atomistic simulation – Simulating the temperature effect in a powder diffraction pattern with molecular dynamics – A new combined approach to investigate stacking faults in lamellar compounds – Factors affecting diffraction broadening analysis – Crystallite size evolution in hydrothermal formation of kaolinite – Particle statistics in synchrotron powder diffractometry – High energy milling of Cu2O powders – Defects in nanocrystalline ceria xerogel – Determination of crystallite size distribution histogram in nanocrystalline anatase powders by XRD – Crystal growth mechanism of kaolinites deduced from crystallite size distribution – Diffraction peak broadening of energetic materials – Calculation of a line profile for the diffractometer with a primary monochromator – I.4 Texture – Characterization of weakly deformed limestone from Chotec, Bohemia by neutron transmission – Multiple scattering from textured polycrystals – II. INSTRUMENTAL – Powgen: A third-generation highresolution high-throughput powder diffraction instrument at the Spallation Neutron Source – Technical concept of the materials science beamline at ALBA – Instrumental calibration of laboratory X-ray powder diffractometers – New anti-air-scatter screen for powder XRD with linear position sensitive detectors – In-situ XRPD of hydrating cement with lab instrument: reflection vs. transmission measurements – In-house characterization of protein powder – Multiple reflections accompanying allowed and forbidden single reflections in bent Si-crystals – 2?-scanning 2D-area detector for high quality powder data collection using synchrotron radiation – III. SOFTWARE – Adaption of a Rietveld code towards clay structure description – Real-space powder diffraction computing on clusters of Graphics Processing Units – Evaluation of algorithms and weighting methods for MEM analysis from powder diffraction data – YAYLA, a program for handling area detector data of glasses – IV. MATERIALS – IV.1 Thin Layers – HTXRD study of atomic layer deposited noble metal thin films heat treated in oxygen – XRD real structure characterization of sputtered Au films different in thickness – Liquid-phase self-terminated growth of MOF thin films: An X-ray diffraction study – IV.2 Nanocrystalline and Amorphous Materials – X-ray study of structure of the Ti O2 nanotubes and nanowires – Core-Shell structure of nanocrystalline Al N in real and reciprocal spaces – Compression and thermal expansion of nanocrystalline Ti N – Diffraction analysis of grain growth in nanocrystalline Ni-W powders prepared by mechanical milling – Orientational degeneracy of antiferromagnetic exchange striction in anisotropic ultrafine Ni O nanocrystals – IV.3 Metals and Alloys – IV.3.1 General – X-ray diffraction analysis of phases in weldments of super duplex stainless steels – X-ray studies of martensitic transformation in Fe-Ni alloys rapidly quenched from the melt – ?-?-?-martensitic transitions influence on the martensite decomposition of quenched steel – IV.3.2 Microstructure, Stress and Texture – Strain relaxation and grain growth in 316LVM stainless steel annealed under pressure – Influence of elastic stress on stain