The 1985 Amsterdam conference brought together researchers active in pattern recognition methodology and the development of practical applications. The first part of the book covers various methodological aspects of image processing, knowledge based and model driven image understanding systems, 3-D reconstruction methods, and application oriented papers. Part II deals with aspects of statistical pattern recognition, the problem of population classification, and topics common to both pattern recognition and artificial intelligence.
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Język Angielski ● Format PDF ● ISBN 9780444599223 ● Redaktor E.S. Gelsema & L.N. Kanal ● Wydawca Elsevier Science ● Opublikowany 2012 ● Do pobrania 6 czasy ● Waluta EUR ● ID 3062439 ● Ochrona przed kopiowaniem Adobe DRM
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