Self-Trapped Excitons discusses the structure and evolution of the self-trapped exciton (STE) in a wide range of materials. It includes a comprehensive review of experiments and extensive tables of data. Emphasis is given throughout to the unity of the basic physics underlying various manifestations of self-trapping, with the theory being developed from a localized, atomistic perspective. The topics treated in detail in relation to STE relaxation include spontaneous symmetry breaking, lattice defect formation, radiation damage, and electronic sputtering.
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Język Angielski ● Format PDF ● ISBN 9783642852367 ● Wydawca Springer Berlin Heidelberg ● Opublikowany 2013 ● Do pobrania 3 czasy ● Waluta EUR ● ID 5782088 ● Ochrona przed kopiowaniem Adobe DRM
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