2 Ebooki wg Sandeep K. Goel
Krishnendu Chakrabarty & Sandeep K. Goel: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size feature …
EPUB
Angielski
DRM
€99.00
Krishnendu Chakrabarty & Sandeep K. Goel: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size feature …
PDF
Angielski
DRM
€99.24
