2 电子书 Sandeep K. Goel
Krishnendu Chakrabarty & Sandeep K. Goel: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size feature …
EPUB
英语
DRM
€98.80
Krishnendu Chakrabarty & Sandeep K. Goel: Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size feature …
PDF
英语
DRM
€99.24
