Sleiman Bou-Sleiman & Mohammed Ismail 
Built-in-Self-Test and Digital Self-Calibration for RF SoCs [PDF ebook] 

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This book will introduce design methodologies, known as Built-in-Self-Test (Bi ST) and Built-in-Self-Calibration (Bi SC), which enhance the robustness of radio frequency (RF) and millimeter wave (mm Wave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mm Wave ICs which will enable successful manufacturing of such microchips in high volume.

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Métodos de Pagamento

Tabela de Conteúdo

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF So Cs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.

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Língua Inglês ● Formato PDF ● Páginas 89 ● ISBN 9781441995483 ● Tamanho do arquivo 1.6 MB ● Editora Springer New York ● Cidade NY ● País US ● Publicado 2011 ● Carregável 24 meses ● Moeda EUR ● ID 2247385 ● Proteção contra cópia DRM social

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