This book will introduce design methodologies, known as Built-in-Self-Test (Bi ST) and Built-in-Self-Calibration (Bi SC), which enhance the robustness of radio frequency (RF) and millimeter wave (mm Wave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mm Wave ICs which will enable successful manufacturing of such microchips in high volume.
Table of Content
Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF So Cs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.
More ebooks from the same author(s) / Editor
18,611 Ebooks in this category
