作者: Andrei Pavlov

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physica …

This is the first major re-assessment of Ivan the Terrible to be published in the West in the post-Soviet period. It breaks away from older stereotypes of the tsar – whether as ‘crazed tyrant’ and ‘e …

This is the first major re-assessment of Ivan the Terrible to be published in the West in the post-Soviet period. It breaks away from older stereotypes of the tsar – whether as ‘crazed tyrant’ and ‘e …