David L. Griscom & Gianfranco Pacchioni 
Defects in SiO2 and Related Dielectrics: Science and Technology [PDF ebook] 

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Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

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Sprache Englisch ● Format PDF ● ISBN 9789401009447 ● Herausgeber David L. Griscom & Gianfranco Pacchioni ● Verlag Springer Netherlands ● Erscheinungsjahr 2012 ● herunterladbar 3 mal ● Währung EUR ● ID 4593459 ● Kopierschutz Adobe DRM
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