Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons...
Tabla de materias
XRF-Basics.- Main Components of X-Ray Spectrometers.- Special Requirements for µ-XRF.- Quantification.- Sample Preparation.- Relations to Other Analytical Methods....
Sobre el autor
Michael Haschke was born 1948, his schooling was combined with teachings for metalworker. After the study of physics at the TU Dresden which was finished 1974 with Ph...