Michael Haschke 
Laboratory Micro-X-Ray Fluorescence Spectroscopy [PDF ebook] 
Instrumentation and Applications

XRF-Basics.- Main Components of X-Ray Spectrometers.- Special Requirements for µ-XRF.- Quantification.- Sample Preparation.- Relations to Other Analytical Methods.- Applications.

Michael Haschke was born 1948, his schooling was combined with teachings for metalworker. After the study of physics at the TU Dresden which was finished 1974 with Ph D he started his career – at first in the Academy of Science of GDR, branch for scientific instrumentation and then in different companies. From the beginning of the 80th he was working in the field of X-Ray analytics. During that time he was responsible for the introduction of energy-dispersive X-Ray spectrometers (EDS) in GDR, for the buildup of the X-Ray product line in Spectro, Kleve including the excitation with polarized radiation, the use of small spectrometers for jewelry analysis and the introduction of poly-capillary based instruments for µ-XRF in Röntgenanalytik Messtechnik Gmb H, Taunusstein in close cooperation with EDAX, USA, the use of µ-XRF as an additional excitation source for electron microscopes in If G, Berlin and finally for the introduction of a complete product line for µ-XRF in Bruker Nano, Gmb H, Berlin. This responsibility was realized as deputy-director or product manager in the different companies. He understood the introduction of new instruments as a combination of the development of the instruments with the introduction into the market. Therefore there is a big experience both for instrumentation as well as for application.