Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Seizo Morita & Franz J. Giessibl
Noncontact Atomic Force Microscopy [PDF ebook]
Volume 2
Noncontact Atomic Force Microscopy [PDF ebook]
Volume 2
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Bahasa Inggris ● Format PDF ● Halaman 401 ● ISBN 9783642014956 ● Ukuran file 16.7 MB ● Editor Seizo Morita & Franz J. Giessibl ● Penerbit Springer Berlin ● Kota Heidelberg ● Negara DE ● Diterbitkan 2009 ● Diunduh 24 bulan ● Mata uang EUR ● ID 2170482 ● Perlindungan salinan DRM sosial