Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Seizo Morita & Franz J. Giessibl
Noncontact Atomic Force Microscopy [PDF ebook]
Volume 2
Noncontact Atomic Force Microscopy [PDF ebook]
Volume 2
购买此电子书可免费获赠一本!
语言 英语 ● 格式 PDF ● 网页 401 ● ISBN 9783642014956 ● 文件大小 16.7 MB ● 编辑 Seizo Morita & Franz J. Giessibl ● 出版者 Springer Berlin ● 市 Heidelberg ● 国家 DE ● 发布时间 2009 ● 下载 24 个月 ● 货币 EUR ● ID 2170482 ● 复制保护 社会DRM