This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
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Lingua Inglese ● Formato EPUB ● ISBN 9783031215148 ● Editore Anand Darji & Sudeb Dasgupta ● Casa editrice Springer Nature Switzerland ● Pubblicato 2022 ● Scaricabile 3 volte ● Moneta EUR ● ID 8806031 ● Protezione dalla copia Adobe DRM
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