N.B. Balamurugan & S. Rajaram 
VLSI Design and Test [EPUB ebook] 
22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

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This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and No C; sensors and interfaces.

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Limba Engleză ● Format EPUB ● ISBN 9789811359507 ● Editor N.B. Balamurugan & S. Rajaram ● Editura Springer Singapore ● Publicat 2019 ● Descărcabil 3 ori ● Valută EUR ● ID 7014333 ● Protecție împotriva copiilor Adobe DRM
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