This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and No C; sensors and interfaces.
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语言 英语 ● 格式 EPUB ● ISBN 9789811359507 ● 编辑 N.B. Balamurugan & S. Rajaram ● 出版者 Springer Singapore ● 发布时间 2019 ● 下载 3 时 ● 货币 EUR ● ID 7014333 ● 复制保护 Adobe DRM
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