E. Meyer & S. Morita 
Noncontact Atomic Force Microscopy [PDF ebook] 

Soporte

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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Idioma Inglés ● Formato PDF ● ISBN 9783642560194 ● Editor E. Meyer & S. Morita ● Editorial Springer Berlin Heidelberg ● Publicado 2012 ● Descargable 3 veces ● Divisa EUR ● ID 6326813 ● Protección de copia Adobe DRM
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