Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
€230.77
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भाषा अंग्रेज़ी ● स्वरूप PDF ● ISBN 9783642560194 ● संपादक E. Meyer & S. Morita ● प्रकाशक Springer Berlin Heidelberg ● प्रकाशित 2012 ● डाउनलोड करने योग्य 3 बार ● मुद्रा EUR ● आईडी 6326813 ● कॉपी सुरक्षा Adobe DRM
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