Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
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语言 英语 ● 格式 PDF ● ISBN 9783642560194 ● 编辑 E. Meyer & S. Morita ● 出版者 Springer Berlin Heidelberg ● 发布时间 2012 ● 下载 3 时 ● 货币 EUR ● ID 6326813 ● 复制保护 Adobe DRM
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