Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
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Lingua Inglese ● Formato EPUB ● Pagine 384 ● ISBN 9781135499259 ● Editore Wai-Kai Chen ● Casa editrice CRC Press ● Pubblicato 2003 ● Scaricabile 3 volte ● Moneta EUR ● ID 7107964 ● Protezione dalla copia Adobe DRM
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