Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
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Język Angielski ● Format EPUB ● Strony 384 ● ISBN 9781135499259 ● Redaktor Wai-Kai Chen ● Wydawca CRC Press ● Opublikowany 2003 ● Do pobrania 3 czasy ● Waluta EUR ● ID 7107964 ● Ochrona przed kopiowaniem Adobe DRM
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