Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
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语言 英语 ● 格式 EPUB ● 网页 384 ● ISBN 9781135499259 ● 编辑 Wai-Kai Chen ● 出版者 CRC Press ● 发布时间 2003 ● 下载 3 时 ● 货币 EUR ● ID 7107964 ● 复制保护 Adobe DRM
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