"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
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语言 英语 ● 格式 PDF ● 网页 1016 ● ISBN 9780203908709 ● 编辑 Rene Van Grieken & A. Markowicz ● 出版者 CRC Press ● 发布时间 2001 ● 下载 3 时 ● 货币 EUR ● ID 7213665 ● 复制保护 Adobe DRM
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