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Ricardo Reis & Yu Cao 
Circuit Design for Reliability [PDF ebook] 

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Cover von Ricardo Reis & Yu Cao: Circuit Design for Reliability (PDF)

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

€96.29
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Inhaltsverzeichnis

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.
Dieses Ebook kaufen – und ein weitere GRATIS erhalten!
Sprache Englisch ● Format PDF ● Seiten 272 ● ISBN 9781461440789 ● Dateigröße 12.3 MB ● Herausgeber Ricardo Reis & Yu Cao ● Verlag Springer New York ● Ort NY ● Land US ● Erscheinungsjahr 2014 ● herunterladbar 24 Monate ● Währung EUR ● ID 3534144 ● Kopierschutz Soziales DRM

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