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Ricardo Reis & Yu Cao
Circuit Design for Reliability [PDF ebook]

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This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

€96.29

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Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

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Bahasa Inggeris ● Format PDF ● Halaman-halaman 272 ● ISBN 9781461440789 ● Saiz fail 12.3 MB ● Penyunting Ricardo Reis & Yu Cao ● Penerbit Springer New York ● Bandar raya NY ● Negara US ● Diterbitkan 2014 ● Muat turun 24 bulan ● Mata wang EUR ● ID 3534144 ● Salin perlindungan Social DRM

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