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Ricardo Reis & Yu Cao 
Circuit Design for Reliability [PDF ebook] 

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Portada de Ricardo Reis & Yu Cao: Circuit Design for Reliability (PDF)

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

€96.29
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Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.
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Idioma Inglés ● Formato PDF ● Páginas 272 ● ISBN 9781461440789 ● Tamaño de archivo 12.3 MB ● Editor Ricardo Reis & Yu Cao ● Editorial Springer New York ● Ciudad NY ● País US ● Publicado 2014 ● Descargable 24 meses ● Divisa EUR ● ID 3534144 ● Protección de copia DRM social

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