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Ricardo Reis & Yu Cao
Circuit Design for Reliability [PDF ebook]

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Copertina de Ricardo Reis & Yu Cao: Circuit Design for Reliability (PDF)

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

€96.29

Cuprins

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

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Limba Engleză ● Format PDF ● Pagini 272 ● ISBN 9781461440789 ● Mărime fișier 12.3 MB ● Editor Ricardo Reis & Yu Cao ● Editura Springer New York ● Oraș NY ● Țară US ● Publicat 2014 ● Descărcabil 24 luni ● Valută EUR ● ID 3534144 ● Protecție împotriva copiilor DRM social

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