Ricardo Reis & Yu Cao 
Circuit Design for Reliability [PDF ebook] 

Ondersteuning

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

€96.29
Betalingsmethoden

Inhoudsopgave

Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.

Koop dit e-boek en ontvang er nog 1 GRATIS!
Taal Engels ● Formaat PDF ● Pagina’s 272 ● ISBN 9781461440789 ● Bestandsgrootte 12.3 MB ● Editor Ricardo Reis & Yu Cao ● Uitgeverij Springer New York ● Stad NY ● Land US ● Gepubliceerd 2014 ● Downloadbare 24 maanden ● Valuta EUR ● ID 3534144 ● Kopieerbeveiliging Sociale DRM

Meer e-boeken van dezelfde auteur (s) / Editor

19.094 E-boeken in deze categorie