This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.
İçerik tablosu
Introduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.Bu e-kitabı satın alın ve 1 tane daha ÜCRETSİZ kazanın!
Dil İngilizce ● Biçim PDF ● Sayfalar 272 ● ISBN 9781461440789 ● Dosya boyutu 12.3 MB ● Editör Ricardo Reis & Yu Cao ● Yayımcı Springer New York ● Kent NY ● Ülke US ● Yayınlanan 2014 ● İndirilebilir 24 aylar ● Döviz EUR ● Kimlik 3534144 ● Kopya koruma Sosyal DRM