This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
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Sprache Englisch ● Format EPUB ● Seiten 138 ● ISBN 9781351227766 ● Verlag CRC Press ● Erscheinungsjahr 2018 ● herunterladbar 3 mal ● Währung EUR ● ID 7121594 ● Kopierschutz Adobe DRM
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