Daniel M. Fleetwood & Ronald D. Schrimpf: Defects in Microelectronic Materials and Devices (PDF) < إلكترونيات , هندسة كهربائية < الهندسة / التقنيات < علوم < آخر الأخبار

Daniel M. Fleetwood & Ronald D. Schrimpf
Defects in Microelectronic Materials and Devices [PDF ebook]

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غلاف Daniel M. Fleetwood & Ronald D. Schrimpf: Defects in Microelectronic Materials and Devices (PDF)

Uncover the Defects that Compromise Performance and Reliability As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe

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شكل PDF ● صفحات 770 ● ISBN 9781420043778 ● محرر Daniel M. Fleetwood & Ronald D. Schrimpf ● الناشر CRC Press ● نشرت 2008 ● للتحميل 3 مرات ● دقة EUR ● هوية شخصية 4115286 ● حماية النسخ Adobe DRM

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Daniel M. Fleetwood Ronald D. Schrimpf

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