Uncover the Defects that Compromise Performance and Reliability As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe
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Formatera PDF ● Sidor 770 ● ISBN 9781420043778 ● Redaktör Daniel M. Fleetwood & Ronald D. Schrimpf ● Utgivare CRC Press ● Publicerad 2008 ● Nedladdningsbara 3 gånger ● Valuta EUR ● ID 4115286 ● Kopieringsskydd Adobe DRM
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