Uncover the Defects that Compromise Performance and Reliability As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe
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Format PDF ● Pages 770 ● ISBN 9781420043778 ● Éditeur Daniel M. Fleetwood & Ronald D. Schrimpf ● Maison d’édition CRC Press ● Publié 2008 ● Téléchargeable 3 fois ● Devise EUR ● ID 4115286 ● Protection contre la copie Adobe DRM
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