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Daniel M. Fleetwood & Ronald D. Schrimpf
Defects in Microelectronic Materials and Devices [PDF ebook]

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Pokrywa Daniel M. Fleetwood & Ronald D. Schrimpf: Defects in Microelectronic Materials and Devices (PDF)

Uncover the Defects that Compromise Performance and Reliability As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe

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Format PDF ● Strony 770 ● ISBN 9781420043778 ● Redaktor Daniel M. Fleetwood & Ronald D. Schrimpf ● Wydawca CRC Press ● Opublikowany 2008 ● Do pobrania 3 czasy ● Waluta EUR ● ID 4115286 ● Ochrona przed kopiowaniem Adobe DRM

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