Uncover the Defects that Compromise Performance and Reliability As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe
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Format PDF ● Pages 770 ● ISBN 9781420043778 ● Editor Daniel M. Fleetwood & Ronald D. Schrimpf ● Publisher CRC Press ● Published 2008 ● Downloadable 3 times ● Currency EUR ● ID 4115286 ● Copy protection Adobe DRM
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