Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, an
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Taal Engels ● Formaat PDF ● Pagina’s 600 ● ISBN 9789047416463 ● Editor J. Drelich & Kash L. Mittal ● Uitgeverij CRC Press ● Gepubliceerd 2005 ● Downloadbare 6 keer ● Valuta EUR ● ID 2615258 ● Kopieerbeveiliging Adobe DRM
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