J. Drelich & Kash L. Mittal 
Atomic Force Microscopy in Adhesion Studies [PDF ebook] 

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Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, an

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语言 英语 ● 格式 PDF ● 网页 600 ● ISBN 9789047416463 ● 编辑 J. Drelich & Kash L. Mittal ● 出版者 CRC Press ● 发布时间 2005 ● 下载 6 时 ● 货币 EUR ● ID 2615258 ● 复制保护 Adobe DRM
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