Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Sprache Englisch ● Format PDF ● ISBN 9783540389675 ● Verlag Springer Berlin Heidelberg ● Erscheinungsjahr 2013 ● herunterladbar 3 mal ● Währung EUR ● ID 6317814 ● Kopierschutz Adobe DRM
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