An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.
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Idioma Inglés ● Formato PDF ● ISBN 9789401150088 ● Editor Eric Garfunkel & Evgeni Gusev ● Editorial Springer Netherlands ● Publicado 2012 ● Descargable 3 veces ● Divisa EUR ● ID 4705911 ● Protección de copia Adobe DRM
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