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Eric Garfunkel & Evgeni Gusev
Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices [PDF ebook]

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Capa do Eric Garfunkel & Evgeni Gusev: Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices (PDF)

An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.

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Língua Inglês ● Formato PDF ● ISBN 9789401150088 ● Editor Eric Garfunkel & Evgeni Gusev ● Editora Springer Netherlands ● Publicado 2012 ● Carregável 3 vezes ● Moeda EUR ● ID 4705911 ● Proteção contra cópia Adobe DRM

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