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Eric Garfunkel & Evgeni Gusev
Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices [PDF ebook]

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Couverture du Eric Garfunkel & Evgeni Gusev: Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices (PDF)

An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.

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Langue Anglais ● Format PDF ● ISBN 9789401150088 ● Éditeur Eric Garfunkel & Evgeni Gusev ● Maison d’édition Springer Netherlands ● Publié 2012 ● Téléchargeable 3 fois ● Devise EUR ● ID 4705911 ● Protection contre la copie Adobe DRM

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