An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.
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语言 英语 ● 格式 PDF ● ISBN 9789401150088 ● 编辑 Eric Garfunkel & Evgeni Gusev ● 出版者 Springer Netherlands ● 发布时间 2012 ● 下载 3 时 ● 货币 EUR ● ID 4705911 ● 复制保护 Adobe DRM
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