An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.
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Język Angielski ● Format PDF ● ISBN 9789401150088 ● Redaktor Eric Garfunkel & Evgeni Gusev ● Wydawca Springer Netherlands ● Opublikowany 2012 ● Do pobrania 3 czasy ● Waluta EUR ● ID 4705911 ● Ochrona przed kopiowaniem Adobe DRM
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