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Bharat Bhushan & Harald Fuchs
Applied Scanning Probe Methods XI [PDF ebook]
Scanning Probe Microscopy Techniques

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Cover of Bharat Bhushan & Harald Fuchs: Applied Scanning Probe Methods XI (PDF)

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Table of Content

Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.

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Language English ● Format PDF ● Pages 236 ● ISBN 9783540850373 ● File size 15.7 MB ● Editor Bharat Bhushan & Harald Fuchs ● Publisher Springer Berlin ● City Heidelberg ● Country DE ● Published 2008 ● Downloadable 24 months ● Currency EUR ● ID 5238393 ● Copy protection Social DRM

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